Abstract
The composition of the inner and outer “semicon” shields in modern
ac cables, and the temperature/pressure conditions under which the
various manufacturing procedures are carried out, would be
expected to influence space charge accumulation under dc stress
significantly. However, few systematic investigations of the
influence of these factors, on space charge accumulation or other
electrical properties of XLPE, have been reported. In this paper
we present space charge profiles for a range of XLPE planar
samples under dc stress. Three different types of semicon
electrodes were investigated, as well as vacuum-evaporated gold.
The samples were also subjected to three different heating/pumping
conditioning procedures.
| Original language | English |
|---|---|
| Title of host publication | Proceedings on NORDIC INSULATION SYMPOSIUM |
| Place of Publication | Copenhagen, Denmark |
| Publisher | ELTEK, Tech. Univ. of Denmark |
| Publication date | 1999 |
| Pages | 205-212 |
| Publication status | Published - 1999 |
| Event | NORD-IS 99 - Copenhagen, Denmark Duration: 1 Jan 1999 → … |
Conference
| Conference | NORD-IS 99 |
|---|---|
| City | Copenhagen, Denmark |
| Period | 01/01/1999 → … |