Abstract
In this paper, the small- and large-signal modeling of InP heterojunction bipolar transistors (HBTs) in transferred substrate (TS) technology is investigated. The small-signal equivalent circuit parameters for TS-HBTs in two-terminal and three-terminal configurations are determined by employing a direct parameter extraction methodology dedicated to III–V based HBTs. It is shown that the modeling of measured S-parameters can be improved in the millimeter-wave frequency range by augmenting the small-signal model with a description of AC current crowding. The extracted elements of the small-signal model structure are employed as a starting point for the extraction of a large-signal model. The developed large-signal model for the TS-HBTs accurately predicts the DC over temperature and small-signal performance over bias as well as the large-signal performance at millimeter-wave frequencies.
Original language | English |
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Journal | International Journal of Microwave and Wireless Technologies |
Volume | 6 |
Issue number | 3-4 |
Pages (from-to) | 243-251 |
ISSN | 1759-0787 |
DOIs | |
Publication status | Published - 2014 |
Keywords
- Research Paper
- Modeling
- Simulation and characterization of devices and circuits
- Linear and non-linear CAD Techniques