Size-induced enhancement of bulk modulus and transition pressure of nanocrystalline Ge

Hua Wang, J.F. Liu, Yongqi He, Wei Chen, Yanwei Wang, Leif Gerward, Jianzhong Jiang

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

In situ energy dispersive X-ray diffraction measurements with synchrotron radiation source have been performed on nanocrystalline Ge with particle sizes 13, 49 and 100 nm by using diamond anvil cell. Whereas the percentage volume collapse at the transition is almost constant, the values of the bulk modulus and transition pressure increase with decreasing particle size. Models are suggested to describe the grain-size dependences of bulk modulus and transition pressure. The trend of the predicted results is consistent with the experimental results while the absolute values are still different from experimental ones.
Original languageEnglish
JournalWuli Xuebao
Volume56
Issue number11
Pages (from-to)6521-6525
ISSN1000-3290
Publication statusPublished - 2007

Keywords

  • synchrotron radiation
  • phase transition
  • bulk modulus
  • XRD

Fingerprint

Dive into the research topics of 'Size-induced enhancement of bulk modulus and transition pressure of nanocrystalline Ge'. Together they form a unique fingerprint.

Cite this