TY - JOUR
T1 - Size-dependent effects in exchange-biased planar Hall effect sensor crosses
AU - Donolato, Marco
AU - Dalslet, Bjarke Thomas
AU - Damsgaard, Christian Danvad
AU - Gunnarsson, K.
AU - Jacobsen, Claus Schelde
AU - Svedlindh, P.
AU - Hansen, Mikkel Fougt
PY - 2011
Y1 - 2011
N2 - Exchange-biased planar Hall effect magnetic field sensor crosses with arm width w have been studied as function of w. For large values of w, the magnetic behavior is hysteresis-free and follows the single domain Stoner-Wohlfarth model. When w is decreased, hysteresis is observed in the sensor response. For intermediate values of w, the magnetization reversal takes place in two steps, and for small values of w, the magnetization reversal takes place in a single step. Based on electrical measurements, magnetic force microscopy, and micromagnetic simulations, the observations are explained by an increasing magnetic shape anisotropy of the arms of the cross. We propose a simple analytical model that captures the essential physics of the observations and parameterizes the effects of the cross-shape on the central part of the cross. (C) 2011 American Institute of Physics. [doi:10.1063/1.3561364]
AB - Exchange-biased planar Hall effect magnetic field sensor crosses with arm width w have been studied as function of w. For large values of w, the magnetic behavior is hysteresis-free and follows the single domain Stoner-Wohlfarth model. When w is decreased, hysteresis is observed in the sensor response. For intermediate values of w, the magnetization reversal takes place in two steps, and for small values of w, the magnetization reversal takes place in a single step. Based on electrical measurements, magnetic force microscopy, and micromagnetic simulations, the observations are explained by an increasing magnetic shape anisotropy of the arms of the cross. We propose a simple analytical model that captures the essential physics of the observations and parameterizes the effects of the cross-shape on the central part of the cross. (C) 2011 American Institute of Physics. [doi:10.1063/1.3561364]
U2 - 10.1063/1.3561364
DO - 10.1063/1.3561364
M3 - Journal article
SN - 0021-8979
VL - 109
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 6
M1 - 064511
ER -