Sinusoidal excitation on the Chua's circuit simulation of limit cycles and chaos

Erik Lindberg

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    Abstract

    Experiments with modelling and simulation of sinusoidal excitation on Chua's circuit are presented. It is demonstrated that the behaviour of the circuit is based on the interaction of two different kinds of energy balance: chaotic behaviour based on a balance between two unstable “states of charging”, and stable limit cycle behaviour based on the balance between the energy lost in the regions with mainly positive losses and the energy gained in the regions with mainly negative losses. Convergence problems observed in connection with simulation of the ideal piecewise-linear model are solved by means of a smooth continuous model of the nonlinear element based on the ideal operational amplifier model instead of a polynomial approximation. The movements of the eigenvalues as functions of the nonlinear resistance are found. Stable limit cycles of periods 1, 2, 3 and 5 are found by introducing losses
    Original languageEnglish
    Title of host publicationProceedings of the IEEE International Symposium on Circuits and Systems
    VolumeVolume 6
    PublisherIEEE
    Publication date1994
    Pages5-8
    ISBN (Print)07-80-31915-X
    DOIs
    Publication statusPublished - 1994
    Event1994 IEEE International Symposium on Circuits and Systems - London, United Kingdom
    Duration: 30 May 19942 Jun 1994
    http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3224

    Conference

    Conference1994 IEEE International Symposium on Circuits and Systems
    Country/TerritoryUnited Kingdom
    CityLondon
    Period30/05/199402/06/1994
    Internet address

    Bibliographical note

    Copyright: 1994 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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