Single-position Hall effect measurements

Research output: PatentPatent – Annual report year: 2014Research

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Single-position Hall effect measurements. / Wang, Fei (Inventor); Petersen, Dirch Hjorth (Inventor); Hansen, Ole (Inventor).

IPC No.: G01B7/14. Patent No.: US2014015552. Jan 16, 2014.

Research output: PatentPatent – Annual report year: 2014Research

Harvard

Wang, F, Petersen, DH & Hansen, O Jan. 16 2014, Single-position Hall effect measurements, Patent No. US2014015552, IPC No. G01B7/14.

APA

Wang, F., Petersen, D. H., & Hansen, O. (2014). IPC No. G01B7/14. Single-position Hall effect measurements. (Patent No. US2014015552).

CBE

Wang F, Petersen DH, Hansen O, inventors. 16-Jan-2014. Single-position Hall effect measurements. IPC No. G01B7/14. Patent No. US2014015552.

MLA

Vancouver

Author

Bibtex

@misc{69d5c713324b49b6ade20001a9f075b5,
title = "Single-position Hall effect measurements",
abstract = "A method for determining a distance (Y) between a first position on and an electrical boundary (34) of a test sample by a multi-point probe comprising four contact elements, comprising: contacting the test sample with the four contact elements (20,22,24,26) at the first position, applying a magnetic field at the first position, performing a first and a second four-point measurement and deriving a first and a second resistance value, calculating a first resistance difference from the first and second resistance values, performing a third and a fourth four-point measurement and deriving a third and a fourth resistance value, calculating a second resistance difference from the third and fourth resistance values, defining a first relation including parameters representing the first resistance difference, the second resistance difference, and the distance between the first position and the electrical boundary, determining the distance by using the first and the second resistance differences in the first relation.",
author = "Fei Wang and Petersen, {Dirch Hjorth} and Ole Hansen",
note = "Also published as: WO2012083955, SG191251, KR20130132558, JP2014503114, CN103380368, and EP2656056.; US2014015552; G01B7/14",
year = "2014",
language = "English",
type = "Patent",

}

RIS

TY - PAT

T1 - Single-position Hall effect measurements

AU - Wang, Fei

AU - Petersen, Dirch Hjorth

AU - Hansen, Ole

N1 - Also published as: WO2012083955, SG191251, KR20130132558, JP2014503114, CN103380368, and EP2656056.

PY - 2014

Y1 - 2014

N2 - A method for determining a distance (Y) between a first position on and an electrical boundary (34) of a test sample by a multi-point probe comprising four contact elements, comprising: contacting the test sample with the four contact elements (20,22,24,26) at the first position, applying a magnetic field at the first position, performing a first and a second four-point measurement and deriving a first and a second resistance value, calculating a first resistance difference from the first and second resistance values, performing a third and a fourth four-point measurement and deriving a third and a fourth resistance value, calculating a second resistance difference from the third and fourth resistance values, defining a first relation including parameters representing the first resistance difference, the second resistance difference, and the distance between the first position and the electrical boundary, determining the distance by using the first and the second resistance differences in the first relation.

AB - A method for determining a distance (Y) between a first position on and an electrical boundary (34) of a test sample by a multi-point probe comprising four contact elements, comprising: contacting the test sample with the four contact elements (20,22,24,26) at the first position, applying a magnetic field at the first position, performing a first and a second four-point measurement and deriving a first and a second resistance value, calculating a first resistance difference from the first and second resistance values, performing a third and a fourth four-point measurement and deriving a third and a fourth resistance value, calculating a second resistance difference from the third and fourth resistance values, defining a first relation including parameters representing the first resistance difference, the second resistance difference, and the distance between the first position and the electrical boundary, determining the distance by using the first and the second resistance differences in the first relation.

M3 - Patent

M1 - US2014015552

Y2 - 2014/01/16

ER -