Single-shot quantitative phase microscopy assisted by an all-dielectric metasurface

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Abstract

We present a new approach for simultaneous capture of two images using a metasurface made of titania nanopillars. We use this technique to make quantitative phase measurements by employing the transport of intensity model.
Original languageEnglish
Publication date2020
Number of pages2
Publication statusPublished - 2020
Event2020 Conference on Lasers and Electro-Optics (CLEO) - San Jose McEnery Convention Center, San Jose, United States
Duration: 11 May 202015 May 2020
http://www.cleoconference.org

Conference

Conference2020 Conference on Lasers and Electro-Optics (CLEO)
LocationSan Jose McEnery Convention Center
CountryUnited States
CitySan Jose
Period11/05/202015/05/2020
Internet address

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