Single grain peak profile measurements within bulk metals during tensile deformation

U. Lienert, J. Almer, W. Pantleon, H.F. Poulsen

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationAbstract booklet
    Number of pages14
    Place of PublicationHamburg
    PublisherDESY
    Publication date2003
    Publication statusPublished - 2003
    EventInternational Workshop on Hard Synchrotron X-Rays for Texture and Strain Analysis - Hamburg, Germany
    Duration: 9 Apr 200312 Apr 2003

    Workshop

    WorkshopInternational Workshop on Hard Synchrotron X-Rays for Texture and Strain Analysis
    CountryGermany
    CityHamburg
    Period09/04/200312/04/2003

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