Abstract
X-ray diffraction is becoming an important tool in the measurements of surface structures. Single crystalline samples are used as in Low Energy Electron Diffraction (LEED)-studies. The X-ray technique is somewhat more involved due to the need of bright, collimated photon sources, in general synchrotron X-rays, and of very accurate angular settings in the ultrahigh-vacuum environment of the sample. We present the technique and discuss examples of experimental results.
| Original language | English |
|---|---|
| Journal | Zeitschrift für Physik B Condensed Matter |
| Volume | 61 |
| Issue number | 4 |
| Pages (from-to) | 415-420 |
| ISSN | 0722-3277 |
| DOIs | |
| Publication status | Published - 1985 |
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