Abstract
X-ray diffraction is becoming an important tool in the measurements of surface structures. Single crystalline samples are used as in Low Energy Electron Diffraction (LEED)-studies. The X-ray technique is somewhat more involved due to the need of bright, collimated photon sources, in general synchrotron X-rays, and of very accurate angular settings in the ultrahigh-vacuum environment of the sample. We present the technique and discuss examples of experimental results.
Original language | English |
---|---|
Journal | Zeitschrift für Physik B Condensed Matter |
Volume | 61 |
Issue number | 4 |
Pages (from-to) | 415-420 |
ISSN | 0722-3277 |
DOIs | |
Publication status | Published - 1985 |