Simulations of the x-ray imaging capabilities of the silicon drift detectors (SDD) for the LOFT wide-field monitor
- Y. Evangelista
- , R. Campana
- , E. Del Monte
- , I. Donnarumma
- , M. Feroci
- , F. Muleri
- , L. Pacciani
- , P. Soffitta
- , A. Rachevski
- , A. Vacchi
- , G. Zampa
- , N. Zampa
- , S. Suchy
- , Søren Brandt
- , M. Hernanz
Research output: Contribution to journal › Conference article › Research › peer-review