Simulations of the x-ray imaging capabilities of the silicon drift detectors (SDD) for the LOFT wide-field monitor

Y. Evangelista, R. Campana, E. Del Monte, I. Donnarumma, M. Feroci, F. Muleri, L. Pacciani, P. Soffitta, A. Rachevski, A. Vacchi, G. Zampa, N. Zampa, S. Suchy, Søren Brandt, M. Hernanz

    Research output: Contribution to journal › Conference article › Research › peer-review

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