Simulations of the x-ray imaging capabilities of the silicon drift detectors (SDD) for the LOFT wide-field monitor

Y. Evangelista, R. Campana, E. Del Monte, I. Donnarumma, M. Feroci, F. Muleri, L. Pacciani, P. Soffitta, A. Rachevski, A. Vacchi, G. Zampa, N. Zampa, S. Suchy, Søren Brandt, M. Hernanz

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    The Large Observatory For X-ray Timing (LOFT), selected by ESA as one of the four Cosmic Vision M3 candidate missions to undergo an assessment phase, will revolutionize the study of compact objects in our galaxy and of the brightest supermassive black holes in active galactic nuclei. The Large Area Detector (LAD), carrying an unprecedented effective area of 10 m^2, is complemented by a coded-mask Wide Field Monitor, in charge of monitoring a large fraction of the sky potentially accessible to the LAD, to provide the history and context for the sources observed by LAD and to trigger its observations on their most interesting and extreme states. In this paper we present detailed simulations of the imaging capabilities of the Silicon Drift Detectors developed for the LOFT Wide Field Monitor detection plane. The simulations explore a large parameter space for both the detector design and the environmental conditions, allowing us to optimize the detector characteristics and demonstrating the X-ray imaging performance of the large-area SDDs in the 2-50 keV energy band.
    Original languageEnglish
    JournalProceedings of SPIE - The International Society for Optical Engineering
    Volume8443
    Issue numberPART 3
    Pages (from-to)84435P
    Number of pages10
    ISSN0277-786X
    DOIs
    Publication statusPublished - 2012
    EventSpace Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray - Amsterdam RAI Convention Ctr., Amsterdam, Netherlands
    Duration: 1 Jul 20126 Jul 2012
    Conference number: 8443

    Conference

    ConferenceSpace Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray
    Number8443
    LocationAmsterdam RAI Convention Ctr.
    Country/TerritoryNetherlands
    CityAmsterdam
    Period01/07/201206/07/2012

    Keywords

    • LOFT wide field monitor
    • Silicon drift detectors
    • SDD
    • Simulations
    • Spatial resolution

    Fingerprint

    Dive into the research topics of 'Simulations of the x-ray imaging capabilities of the silicon drift detectors (SDD) for the LOFT wide-field monitor'. Together they form a unique fingerprint.

    Cite this