We present a method to optimise conditions for industrial computed tomography (CT). This optimisation is based on a deterministic simulation. Our algorithm finds task-specific CT equipment settings to achieve optimal exposure parameters by means of an STL-model of the specimen and a raytracing method. These parameters are positioning and orientation of the specimen, X-ray tube voltage and prefilter thickness.
|Title of host publication||International Symposium on Digital Industrial Radiology and Computed Tomography|
|Publication status||Published - 2011|
|Event||International Symposium on Digital Industrial Radiology and Computed Tomography - Berlin|
Duration: 1 Jan 2011 → …
|Conference||International Symposium on Digital Industrial Radiology and Computed Tomography|
|Period||01/01/2011 → …|