Abstract
We present a method to optimise conditions for industrial computed tomography (CT). This optimisation is based on a deterministic simulation. Our algorithm finds task-specific CT equipment settings to achieve optimal exposure
parameters by means of an STL-model of the specimen and a raytracing method. These parameters are positioning and orientation of the specimen, X-ray tube voltage and prefilter thickness.
Original language | English |
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Title of host publication | International Symposium on Digital Industrial Radiology and Computed Tomography |
Volume | MO.3.1 |
Publication date | 2011 |
Publication status | Published - 2011 |
Event | International Symposium on Digital Industrial Radiology and Computed Tomography 2011 - Berlin, Germany Duration: 20 Jun 2011 → 22 Jun 2011 |
Conference
Conference | International Symposium on Digital Industrial Radiology and Computed Tomography 2011 |
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Country/Territory | Germany |
City | Berlin |
Period | 20/06/2011 → 22/06/2011 |