Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi-Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.
|Journal||Acta Crystallographica Section A: Foundations of Crystallography|
|Publication status||Published - 2022|
- Diffraction imaging
- Dynamical diffraction