Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Mads Carlsen; Carsten Detlefs; Can Yildirim; Trygve Ræder; Hugh Simons

doi:10.1107/S205327332200866X

Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Mads Carlsen, Carsten Detlefs, Can Yildirim, Trygve Ræder, Hugh Simons

Department of Physics

European Synchrotron Radiation Facility

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi-Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.

Original language	English
Journal	Acta Crystallographica Section A: Foundations of Crystallography
Volume	78
Pages (from-to)	482-490
ISSN	0108-7673
DOIs	https://doi.org/10.1107/S205327332200866X
Publication status	Published - 2022

Keywords

Diffraction imaging
Dynamical diffraction
Simulation

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abstract = "Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi-Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.",

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AU - Detlefs, Carsten

AU - Yildirim, Can

AU - Ræder, Trygve

AU - Simons, Hugh

PY - 2022

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AB - Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi-Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.

KW - Diffraction imaging

KW - Dynamical diffraction

KW - Simulation

U2 - 10.1107/S205327332200866X

DO - 10.1107/S205327332200866X

M3 - Journal article

C2 - 36318069

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JO - Acta Crystallographica Section A: Foundations of Crystallography

JF - Acta Crystallographica Section A: Foundations of Crystallography

ER -

Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Abstract

Keywords

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