Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Mads Carlsen, Carsten Detlefs, Can Yildirim, Trygve Ræder, Hugh Simons

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Dark-field X-ray microscopy is a diffraction-based synchrotron imaging technique capable of imaging defects in the bulk of extended crystalline samples. Numerical simulations are presented of image formation in such a microscope using numerical integration of the dynamical Takagi-Taupin equations and wavefront propagation. The approach is validated by comparing simulated images with experimental data from a near-perfect single crystal of diamond containing a single stacking-fault defect in the illuminated volume.
Original languageEnglish
JournalActa Crystallographica Section A: Foundations of Crystallography
Pages (from-to)482-490
Publication statusPublished - 2022


  • Diffraction imaging
  • Dynamical diffraction
  • Simulation


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