Simulating and optimizing compound refractive lens-based X-ray microscopes

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Abstract

A comprehensive optical description of compound refractive lenses (CRLs) in condensing and full-field X-ray microscopy applications is presented. The formalism extends ray-transfer matrix analysis by accounting for X-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, spatial acceptance (vignetting), chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries. These expressions show that the numerical aperture will be maximized and chromatic aberration will be minimized at the thick-lens limit. This limit may be satisfied by a range of CRL geometries, suggesting alternative approaches to improving the resolution and efficiency of CRLs and X-ray microscopes.
Original languageEnglish
JournalJournal of Synchrotron Radiation
Volume24
Issue number2
Pages (from-to)392-401
Number of pages10
ISSN0909-0495
DOIs
Publication statusPublished - 2017

Keywords

  • Instrumentation
  • Compound refractive lenses
  • Ray transfer matrix
  • X-ray imaging
  • X-ray microscopy
  • X-ray optics

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