Silicon Pore Optics development for ATHENA

Maximilien J. Collon, Giuseppe Vacanti, Ramses Guenther, Alex Yanson, Nicolas Barriere, Boris Landgraf, Mark Vervest, Abdelhakim Chatbi, Marco W. Beijersbergen, Marcos Bavdaz, Eric Wille, Jeroen Haneveld, Arenda Koelewijn, Anne Leenstra, Maurice Wijnperle, Coen van Baren, Peter Mueller, Michael Krumrey, Vadim Burwitz, Giovanni PareschiPaolo Conconi, Finn E. Christensen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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    Abstract

    The ATHENA mission, a European large (L) class X-ray observatory to be launched in 2028, will essentially consist of an X-ray lens and two focal plane instruments. The lens, based on a Wolter-I type double reflection grazing incidence angle design, will be very large (similar to 3 m in diameter) to meet the science requirements of large effective area (1-2 m(2) at a few keV) at a focal length of 12 m. To meet the high angular resolution (5 arc seconds) requirement the X-ray lens will also need to be very accurate. Silicon Pore Optics (SPO) technology has been invented to enable building such a lens and thus enabling the ATHENA mission. We will report in this paper on the latest status of the development, including details of X-ray test campaigns.
    Original languageEnglish
    Title of host publicationProceedings of SPIE
    Number of pages11
    Volume9603
    PublisherSPIE - International Society for Optical Engineering
    Publication date2015
    Article number96030K
    DOIs
    Publication statusPublished - 2015
    EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII: Conference 9603 - San Diego Convention Center, San Diego, United States
    Duration: 10 Aug 201513 Aug 2015
    Conference number: 7

    Conference

    ConferenceOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII
    Number7
    LocationSan Diego Convention Center
    Country/TerritoryUnited States
    CitySan Diego
    Period10/08/201513/08/2015
    SeriesProceedings of SPIE - The International Society for Optical Engineering
    ISSN0277-786X

    Bibliographical note

    Copyright 2015 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

    Keywords

    • X-ray optics
    • X-ray astronomy
    • silicon
    • wafer
    • stack
    • pore optics
    • X-ray telescopes
    • ATHENA
    • SPO

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