Sensitometric Properties and Image Quality of Radiographic Film and Paper

Joseph Czeslaw Domanus

Sensitometric Properties and Image Quality of Radiographic Film and Paper

Joseph Czeslaw Domanus

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	11th World Conference on Nondestructive Testing, Las Vegas, 3-8 November 1985
Editors	L. K. Jones
Place of Publication	Colombus
Publisher	World Conference on Nondestructive Testing
Publication date	1985
Pages	520-527
Publication status	Published - 1985
Event	11th World Conference on Nondestructive Testing - Las Vegas, United States Duration: 3 Nov 1985 → 8 Nov 1985 Conference number: 11

Conference

Conference	11th World Conference on Nondestructive Testing
Number	11
Country/Territory	United States
City	Las Vegas
Period	03/11/1985 → 08/11/1985

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Cite this

@inproceedings{ac01ff57dbd8469aafe9e2199822de8b,

title = "Sensitometric Properties and Image Quality of Radiographic Film and Paper",

author = "Domanus, {Joseph Czeslaw}",

year = "1985",

language = "English",

pages = "520--527",

editor = "Jones, {L. K.}",

booktitle = "11th World Conference on Nondestructive Testing, Las Vegas, 3-8 November 1985",

publisher = "World Conference on Nondestructive Testing",

note = "11th World Conference on Nondestructive Testing, WCNDT 85 ; Conference date: 03-11-1985 Through 08-11-1985",

}

Sensitometric Properties and Image Quality of Radiographic Film and Paper. / Domanus, Joseph Czeslaw.

11th World Conference on Nondestructive Testing, Las Vegas, 3-8 November 1985. ed. / L. K. Jones. Colombus : World Conference on Nondestructive Testing, 1985. p. 520-527.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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M3 - Article in proceedings

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EP - 527

BT - 11th World Conference on Nondestructive Testing, Las Vegas, 3-8 November 1985

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PB - World Conference on Nondestructive Testing

CY - Colombus

T2 - 11th World Conference on Nondestructive Testing

Y2 - 3 November 1985 through 8 November 1985

ER -