SENSITIVITY ANALYSIS ON THE EFFECT OF MEASUREMENT NOISE AND SAMPLING FREQUENCY ON THE CALCULATION OF THE TEMPORAL LIGHT ARTEFACTS

Anders Thorseth, J. Linden, C. A. Bouroussis

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

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    Abstract

    Temporal light modulation (TLM) and the resulting temporal light artefacts (TLA) can cause problems with health and wellbeing for users of lighting products. Therefore, TLM has to be measured accurately and repeatably. This study investigates important factors influencing the measurement uncertainty of TLM measurements. The study shows how measurement uncertainty on central TLM parameters can have a significant effect on the calculation of TLA. Specifically, we show a linear relationship between DC offset and the expected error. Further we show severe effects of random noise on PstLM on certain waveforms. And lastly, we show a curious effect related to SVM of pulse width modulated signals and the measurement sampling frequency.

    Original languageEnglish
    Title of host publicationProceedings of the Conference CIE 2021
    PublisherCIE - International Commission on Illumination
    Publication date2022
    Pages245–254
    DOIs
    Publication statusPublished - 2022
    EventCIE 2021 Midterm Meeting & Conference: Light for Life - Living with Light - Online event, Kuala Lumpur, Malaysia
    Duration: 27 Sept 202129 Sept 2021
    https://malaysia2021.cie.co.at/

    Conference

    ConferenceCIE 2021 Midterm Meeting & Conference
    LocationOnline event
    Country/TerritoryMalaysia
    CityKuala Lumpur
    Period27/09/202129/09/2021
    Internet address

    Keywords

    • Photometry
    • Temporal light modulation
    • TLM
    • Temporal light artefacts
    • TLA
    • Flicker
    • Measurement uncertainty
    • Propagation of uncertainty

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