Sensitivity analysis of the Benchmark Simulation Model no 1

Marie-Noëlle Pons, Ulf Jeppsson, Xavier Flores Alsina, Lorenzo Benedetti, M Laurenco da Silva, Ingmar Nopens, Jens Alex, JB Copp, Krist Gernaey, Christian Rosen, Jean-Philippe Steyer, Peter Vanrolleghem

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationComputer Aided Chemical Engineering, on CD
PublisherElsevier
Publication date2008
ISBN (Print)978-0-444-53228-2
Publication statusPublished - 2008
Event18th European Symposium on Computer Aided Process Engineering - Lyon, France
Duration: 1 Jun 20084 Jun 2008
Conference number: 18

Conference

Conference18th European Symposium on Computer Aided Process Engineering
Number18
Country/TerritoryFrance
CityLyon
Period01/06/200804/06/2008

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