Sensitivities of JEM-X

Niels Jørgen Stenfeldt Westergaard, Niels Lund

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The mask design for JEM-X is now finalized regarding the hole pattern and mechnical support structure. The engineering model of the detectors with collimators is under construction. The JEM-X sensitivities for source detection in various circumstances are reviewed with proper regard to the way INTEGRAL will carry out its pointed observations. An important fraction of the INTEGRAL observation time will be used for scans along the galactic plane and observations of the central region of our galaxy. The JEM-X performance for this type of observations is discussed. The software tools used to carry out the detailed observation simulations are described.
    Original languageEnglish
    JournalAstrophysical Letters & Communications
    Volume39
    Issue number1-6
    Pages (from-to)885-+
    ISSN0888-6512
    Publication statusPublished - 1999

    Keywords

    • sensitivity
    • INTEGRAL
    • X-ray astronomy
    • JEM-X

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