Secondary particle emission from water ice irradiated by photons and charged particles

Jørgen Schou, M. Shi, D.A. Bahr, R.A. Baragiola, D.E. Grosjean, W. Svendsen, R. Vidal

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	1995
Publication status	Published - 1995
Event	Symposium on fundamental physics in microscopy and microanalysis - Houston, United States Duration: 6 May 1995 → 11 May 1995

Conference	Symposium on fundamental physics in microscopy and microanalysis
Country/Territory	United States
City	Houston
Period	06/05/1995 → 11/05/1995

OpenUrl availability

@conference{b5a7227fcc1a45329d163d7eaa1b5596,

title = "Secondary particle emission from water ice irradiated by photons and charged particles",

keywords = "Optisk m{\aa}leteknik og informationsbehandling",

author = "J{\o}rgen Schou and M. Shi and D.A. Bahr and R.A. Baragiola and D.E. Grosjean and W. Svendsen and R. Vidal",

year = "1995",

language = "English",

note = "Symposium on fundamental physics in microscopy and microanalysis ; Conference date: 06-05-1995 Through 11-05-1995",

}

TY - ABST

T1 - Secondary particle emission from water ice irradiated by photons and charged particles

AU - Schou, Jørgen

AU - Shi, M.

AU - Bahr, D.A.

AU - Baragiola, R.A.

AU - Grosjean, D.E.

AU - Svendsen, W.

AU - Vidal, R.

PY - 1995

Y1 - 1995

KW - Optisk måleteknik og informationsbehandling

M3 - Conference abstract for conference

T2 - Symposium on fundamental physics in microscopy and microanalysis

Y2 - 6 May 1995 through 11 May 1995

ER -