| Original language | English |
|---|---|
| Journal | Scanning Microscopy |
| Volume | 3 |
| Pages (from-to) | 429-433 |
| ISSN | 0891-7035 |
| Publication status | Published - 1989 |
Cite this
Schou, J. (1989). Secondary Electron Emission: Progress and Prospects. Scanning Microscopy, 3, 429-433.