Secondary electron emission from solids: Fundamental aspects

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date1995
    Publication statusPublished - 1995
    EventScanning microscopy meeting '95 - Houston, TX (US), 6-11 May
    Duration: 1 Jan 1995 → …

    Conference

    ConferenceScanning microscopy meeting '95
    CityHouston, TX (US), 6-11 May
    Period01/01/1995 → …

    Cite this

    Schou, J. (1995). Secondary electron emission from solids: Fundamental aspects. Abstract from Scanning microscopy meeting '95, Houston, TX (US), 6-11 May, .