Second-order statistical property to partially developed speckle and its applications to speckle metrology (poster)

W. Wang, Steen Grüner Hanson, Y. Miyamoto, M. Takeda

    Research output: Contribution to conferencePosterResearch

    Original languageEnglish
    Publication date2005
    Publication statusPublished - 2005
    Event6th Pacific Rim Conference on Lasers and Electro-Optics 2005 - Tokyo, Japan
    Duration: 11 Jul 200515 Jul 2005
    Conference number: 6
    https://ieeexplore.ieee.org/xpl/conhome/10492/proceeding

    Conference

    Conference6th Pacific Rim Conference on Lasers and Electro-Optics 2005
    Number6
    Country/TerritoryJapan
    CityTokyo
    Period11/07/200515/07/2005
    Internet address

    Cite this