Second-order statistical property to partially developed speckle and its applications to speckle metrology (poster)

W. Wang, Steen Grüner Hanson, Y. Miyamoto, M. Takeda

    Research output: Contribution to conferencePosterResearch

    Original languageEnglish
    Publication date2005
    Publication statusPublished - 2005
    EventInternational Quantum Electronics Conference and the Pacific Rim Conference on Lasers and Electro-Optics 2005 - Tokyo, Japan
    Duration: 11 Jul 200515 Jul 2005

    Conference

    ConferenceInternational Quantum Electronics Conference and the Pacific Rim Conference on Lasers and Electro-Optics 2005
    Country/TerritoryJapan
    CityTokyo
    Period11/07/200515/07/2005

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