Second-harmonic imaging of poled silica waveguides

Jesper Arentoft, Kjeld Pedersen, Sergey I. Bozhevolnyi, Martin Kristensen, Ping Yu, Christian Bergenstof Nielsen

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Abstract

Electric-field poled silica-based waveguides are characterized by measurements of second-harmonic generation (SHG) and of the linear electro-optic effect (LEO). A SHG scanning technique allowing for high-resolution imaging of poled devices is demonstrated. Scans along the direction of the poling field show that the second-order optical nonlinearity is located near the interface between differently doped glass layers. Both SHG and LEO measurements indicate that the ratio between the main elements of the second-order nonlinear optical susceptibility tensor, chi(33)((2)) and chi(31)((2)), is significantly smaller than three. (C) 2000 American Institute of Physics.
Original languageEnglish
JournalApplied Physics Letters
Volume76
Issue number1
Pages (from-to)25-27
ISSN0003-6951
DOIs
Publication statusPublished - 2000

Bibliographical note

Copyright (2000) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Keywords

  • GLASS

Cite this

Arentoft, J., Pedersen, K., Bozhevolnyi, S. I., Kristensen, M., Yu, P., & Nielsen, C. B. (2000). Second-harmonic imaging of poled silica waveguides. Applied Physics Letters, 76(1), 25-27. https://doi.org/10.1063/1.125644