Electric-field poled silica-based waveguides are characterized by measurements of second-harmonic generation (SHG) and of the linear electro-optic effect (LEO). A SHG scanning technique allowing for high-resolution imaging of poled devices is demonstrated. Scans along the direction of the poling field show that the second-order optical nonlinearity is located near the interface between differently doped glass layers. Both SHG and LEO measurements indicate that the ratio between the main elements of the second-order nonlinear optical susceptibility tensor, chi(33)((2)) and chi(31)((2)), is significantly smaller than three. (C) 2000 American Institute of Physics.
Bibliographical noteCopyright (2000) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Arentoft, J., Pedersen, K., Bozhevolnyi, S. I., Kristensen, M., Yu, P., & Nielsen, C. B. (2000). Second-harmonic imaging of poled silica waveguides. Applied Physics Letters, 76(1), 25-27. https://doi.org/10.1063/1.125644