Electric-field poled silica-based waveguides are characterized by measurements of second-harmonic generation (SHG) and of the linear electro-optic effect (LEO). A SHG scanning technique allowing for high-resolution imaging of poled devices is demonstrated. Scans along the direction of the poling field show that the second-order optical nonlinearity is located near the interface between differently doped glass layers. Both SHG and LEO measurements indicate that the ratio between the main elements of the second-order nonlinear optical susceptibility tensor, chi(33)((2)) and chi(31)((2)), is significantly smaller than three. (C) 2000 American Institute of Physics.
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