Scanning second-harmonic optical microscopy of self-assembled InAlGaAs quantum dots

B. Vohnsen; S. I. Bozhevolnyi; K. Pedersen; John Erland Østergaard; Jacob Riis Jensen; Kristjan Leosson; Jørn Märcher Hvam

Scanning second-harmonic optical microscopy of self-assembled InAlGaAs quantum dots

B. Vohnsen
, S. I. Bozhevolnyi
, K. Pedersen
, John Erland Østergaard
, Jacob Riis Jensen
, Kristjan Leosson
, Jørn Märcher Hvam

Aalborg University

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

Microscopy provides a suitable technique for local probing of small ensembles of (or even individual) QD's, and when combined with the detection of second-harmonic (SH) generation the technique becomes suitable to reveal tiny changes of symmetry originating either in the material structures or in the illumination itself. Thus, a combination of scanning microscopy with SH detection may be a highly suitable candidate to reveal the presence of QD's embedded in an otherwise isotropic material. We have used scanning far-field (SFOM) and scanning near field optical microscopy (SNOM) techniques to locally probe small ensembles of self-assembled InAlGaAs QD's.

Original language	English
Title of host publication	Technical Digest. Quantum Electronics and Laser Science Conference
Number of pages	135
Publisher	Opt. Soc. America
Publication date	2001
ISBN (Print)	15-57-52663-x
Publication status	Published - 2001
Event	2001 Quantum Electronics and Laser Science Conference - Baltimore, MD, United States Duration: 6 May 2001 → 10 May 2001 http://www.opticsinfobase.org/search.cfm?meetingid=19&year=2001

Conference

Conference	2001 Quantum Electronics and Laser Science Conference
Country/Territory	United States
City	Baltimore, MD
Period	06/05/2001 → 10/05/2001
Internet address	http://www.opticsinfobase.org/search.cfm?meetingid=19&year=2001

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@inproceedings{db4cd7d91ab94396b105b89e71829a54,

title = "Scanning second-harmonic optical microscopy of self-assembled InAlGaAs quantum dots",

abstract = "Microscopy provides a suitable technique for local probing of small ensembles of (or even individual) QD's, and when combined with the detection of second-harmonic (SH) generation the technique becomes suitable to reveal tiny changes of symmetry originating either in the material structures or in the illumination itself. Thus, a combination of scanning microscopy with SH detection may be a highly suitable candidate to reveal the presence of QD's embedded in an otherwise isotropic material. We have used scanning far-field (SFOM) and scanning near field optical microscopy (SNOM) techniques to locally probe small ensembles of self-assembled InAlGaAs QD's.",

author = "B. Vohnsen and Bozhevolnyi, \{S. I.\} and K. Pedersen and {\O}stergaard, \{John Erland\} and Jensen, \{Jacob Riis\} and Kristjan Leosson and Hvam, \{J{\o}rn M{\"a}rcher\}",

year = "2001",

language = "English",

isbn = "15-57-52663-x",

booktitle = "Technical Digest. Quantum Electronics and Laser Science Conference",

publisher = "Opt. Soc. America",

note = "2001 Quantum Electronics and Laser Science Conference, QELS 2001 ; Conference date: 06-05-2001 Through 10-05-2001",

url = "http://www.opticsinfobase.org/search.cfm?meetingid=19\&year=2001",

}

Vohnsen, B, Bozhevolnyi, SI, Pedersen, K, Østergaard, JE, Jensen, JR, Leosson, K & Hvam, JM 2001, Scanning second-harmonic optical microscopy of self-assembled InAlGaAs quantum dots. in Technical Digest. Quantum Electronics and Laser Science Conference. Opt. Soc. America, 2001 Quantum Electronics and Laser Science Conference, Baltimore, MD, United States, 06/05/2001.

TY - GEN

T1 - Scanning second-harmonic optical microscopy of self-assembled InAlGaAs quantum dots

AU - Vohnsen, B.

AU - Bozhevolnyi, S. I.

AU - Pedersen, K.

AU - Østergaard, John Erland

AU - Jensen, Jacob Riis

AU - Leosson, Kristjan

AU - Hvam, Jørn Märcher

PY - 2001

Y1 - 2001

N2 - Microscopy provides a suitable technique for local probing of small ensembles of (or even individual) QD's, and when combined with the detection of second-harmonic (SH) generation the technique becomes suitable to reveal tiny changes of symmetry originating either in the material structures or in the illumination itself. Thus, a combination of scanning microscopy with SH detection may be a highly suitable candidate to reveal the presence of QD's embedded in an otherwise isotropic material. We have used scanning far-field (SFOM) and scanning near field optical microscopy (SNOM) techniques to locally probe small ensembles of self-assembled InAlGaAs QD's.

AB - Microscopy provides a suitable technique for local probing of small ensembles of (or even individual) QD's, and when combined with the detection of second-harmonic (SH) generation the technique becomes suitable to reveal tiny changes of symmetry originating either in the material structures or in the illumination itself. Thus, a combination of scanning microscopy with SH detection may be a highly suitable candidate to reveal the presence of QD's embedded in an otherwise isotropic material. We have used scanning far-field (SFOM) and scanning near field optical microscopy (SNOM) techniques to locally probe small ensembles of self-assembled InAlGaAs QD's.

M3 - Article in proceedings

SN - 15-57-52663-x

BT - Technical Digest. Quantum Electronics and Laser Science Conference

PB - Opt. Soc. America

T2 - 2001 Quantum Electronics and Laser Science Conference

Y2 - 6 May 2001 through 10 May 2001

ER -

Scanning second-harmonic optical microscopy of self-assembled InAlGaAs quantum dots

Abstract

Conference

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