Scanning second-harmonic optical microscopy of self-assembled InAlGaAs quantum dots

B. Vohnsen, S. I. Bozhevolnyi, K. Pedersen, John Erland Østergaard, Jacob Riis Jensen, Kristjan Leosson, Jørn Märcher Hvam

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Microscopy provides a suitable technique for local probing of small ensembles of (or even individual) QD's, and when combined with the detection of second-harmonic (SH) generation the technique becomes suitable to reveal tiny changes of symmetry originating either in the material structures or in the illumination itself. Thus, a combination of scanning microscopy with SH detection may be a highly suitable candidate to reveal the presence of QD's embedded in an otherwise isotropic material. We have used scanning far-field (SFOM) and scanning near field optical microscopy (SNOM) techniques to locally probe small ensembles of self-assembled InAlGaAs QD's.
Original languageEnglish
Title of host publicationTechnical Digest. Quantum Electronics and Laser Science Conference
Number of pages135
PublisherOpt. Soc. America
Publication date2001
ISBN (Print)15-57-52663-x
Publication statusPublished - 2001
Event2001 Quantum Electronics and Laser Science Conference - Baltimore, MD, United States
Duration: 6 May 200110 May 2001
http://www.opticsinfobase.org/search.cfm?meetingid=19&year=2001

Conference

Conference2001 Quantum Electronics and Laser Science Conference
CountryUnited States
CityBaltimore, MD
Period06/05/200110/05/2001
Internet address

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