@inbook{d0421d1fcadc411aba69d275144aa3ce,
title = "Scanning Conductive Torsion Mode",
keywords = "Scanning probe microscopy, Atomic force microscopy, Torsional resonance mode, Non-contact mode, Current sensing, Topography, Soft materials and fragile structures, Organic electronics, Conducting polymers, Self-assembly molecules",
author = "Ling Sun and Elmar Bonaccurso",
year = "2015",
doi = "10.1007/978-3-662-44551-8\_6",
language = "English",
isbn = " 978-3-662-44550-1 ",
pages = "199--225",
editor = "Kumar, \{ Challa S.S.R. \}",
booktitle = "Surface Science Tools for Nanomaterials Characterization",
publisher = "Springer",
}