Scanning Conductive Torsion Mode

Ling Sun, Elmar Bonaccurso

    Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

    Original languageEnglish
    Title of host publicationSurface Science Tools for Nanomaterials Characterization
    Editors Challa S.S.R. Kumar
    PublisherSpringer
    Publication date2015
    Pages199-225
    Chapter6
    ISBN (Print) 978-3-662-44550-1
    ISBN (Electronic)978-3-662-44551-8
    DOIs
    Publication statusPublished - 2015

    Keywords

    • Scanning probe microscopy
    • Atomic force microscopy
    • Torsional resonance mode
    • Non-contact mode
    • Current sensing
    • Topography
    • Soft materials and fragile structures
    • Organic electronics
    • Conducting polymers
    • Self-assembly molecules

    Cite this

    Sun, L., & Bonaccurso, E. (2015). Scanning Conductive Torsion Mode. In C. S. S. R. Kumar (Ed.), Surface Science Tools for Nanomaterials Characterization (pp. 199-225). Springer. https://doi.org/10.1007/978-3-662-44551-8_6