Saturation of charge noise in Single Electron Tunneling
                transistor

A.N. Tavkhelidze, Jesper Mygind, L.S. Kuzmin, O. Gorbonosov

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Czechoslovak Journal of Physics
Volume	46
Issue number	S4
Pages (from-to)	2287-2288
ISSN	0011-4626
Publication status	Published - 1996
Event	21st International Conference on Low Temperature Physics - Prague, Czech Republic Duration: 8 Aug 1996 → 14 Aug 1996 Conference number: 21

Conference	21st International Conference on Low Temperature Physics
Number	21
Country/Territory	Czech Republic
City	Prague
Period	08/08/1996 → 14/08/1996

OpenUrl availability

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title = "Saturation of charge noise in Single Electron Tunneling transistor",

author = "A.N. Tavkhelidze and Jesper Mygind and L.S. Kuzmin and O. Gorbonosov",

year = "1996",

language = "English",

volume = "46",

pages = "2287--2288",

journal = "Czechoslovak Journal of Physics",

issn = "0011-4626",

publisher = "Springer New York",

number = "S4",

note = "21st International Conference on Low Temperature Physics, LT21 ; Conference date: 08-08-1996 Through 14-08-1996",

}

TY - JOUR

T1 - Saturation of charge noise in Single Electron Tunneling transistor

AU - Tavkhelidze, A.N.

AU - Mygind, Jesper

AU - Kuzmin, L.S.

AU - Gorbonosov, O.

N1 - Conference code: 21

PY - 1996

Y1 - 1996

M3 - Journal article

VL - 46

SP - 2287

EP - 2288

JO - Czechoslovak Journal of Physics

JF - Czechoslovak Journal of Physics

SN - 0011-4626

IS - S4

T2 - 21st International Conference on Low Temperature Physics

Y2 - 8 August 1996 through 14 August 1996

ER -