Sampled Noise in Switched Current Circuits

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    Abstract

    The understanding of noise in analog sampled data systems is vital for the design of high resolution circuitry. In this paper a general description of sampled and held noise is presented. The noise calculations are verified by measurements on an analog delay line implemented using switched-current (SI) technique.
    Original languageEnglish
    Title of host publicationProc. 15th NORCHIP Conference
    Place of PublicationCopenhagen
    PublisherTechnoconsult
    Publication date1997
    Pages44-51
    Publication statusPublished - 1997
    Event15th NORCHIP Conference - Tallinn, Estonia
    Duration: 10 Nov 199711 Nov 1997

    Conference

    Conference15th NORCHIP Conference
    CountryEstonia
    CityTallinn
    Period10/11/199711/11/1997

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