Abstract
A method for computing uncertainties of measured s-parameters is presented. Unlike the specification software provided with network analyzers, the new method is capable of calculating the uncertainties of arbitrary s-parameter sets and instrument settings.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 23rd European Microwave Conference |
| Publisher | IEEE |
| Publication date | 1993 |
| Pages | 866-868 |
| DOIs | |
| Publication status | Published - 1993 |
| Event | Microwave Conference - Madrid, Spain Duration: 1 Jan 1993 → … Conference number: 23rd |
Conference
| Conference | Microwave Conference |
|---|---|
| Number | 23rd |
| City | Madrid, Spain |
| Period | 01/01/1993 → … |
Bibliographical note
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