S-parameter uncertainty computations

Jens Vidkjær

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    Abstract

    A method for computing uncertainties of measured s-parameters is presented. Unlike the specification software provided with network analyzers, the new method is capable of calculating the uncertainties of arbitrary s-parameter sets and instrument settings.
    Original languageEnglish
    Title of host publicationProceedings of the 23rd European Microwave Conference
    PublisherIEEE
    Publication date1993
    Pages866-868
    DOIs
    Publication statusPublished - 1993
    EventMicrowave Conference - Madrid, Spain
    Duration: 1 Jan 1993 → …
    Conference number: 23rd

    Conference

    ConferenceMicrowave Conference
    Number23rd
    CityMadrid, Spain
    Period01/01/1993 → …

    Bibliographical note

    Copyright: 1993 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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