Abstract
A method for computing uncertainties of measured s-parameters is presented. Unlike the specification software provided with network analyzers, the new method is capable of calculating the uncertainties of arbitrary s-parameter sets and instrument settings.
Original language | English |
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Title of host publication | Proceedings of the 23rd European Microwave Conference |
Publisher | IEEE |
Publication date | 1993 |
Pages | 866-868 |
DOIs | |
Publication status | Published - 1993 |
Event | Microwave Conference - Madrid, Spain Duration: 1 Jan 1993 → … Conference number: 23rd |
Conference
Conference | Microwave Conference |
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Number | 23rd |
City | Madrid, Spain |
Period | 01/01/1993 → … |