Abstract
Float-Zone (FZ) crystal growth process is a critical process for producing ultra-pure silicon crystal with extremely low impurities, particularly low oxygen level. However, the occasional oxide problem on polysilicon surface acts as a impediment to the process efficiency. Hence, this study aims to address this problem by conducting root cause analysis. Specifically, association rule mining is applied on a dataset with the input identified by a fishbone diagram from different aspects. The results showed that a high moisture level from the early phase could potentially be a critical contributor to the oxide problem, thereby indicating the next step of research – exploring the underlying reasons for the high moisture level.
Original language | English |
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Title of host publication | European Society for Precision Engineering and Nanotechnology, Conference Proceedings : 24th International Conference and Exhibition, EUSPEN 2024 |
Number of pages | 3 |
Publisher | euspen |
Publication status | Accepted/In press - 2025 |
Event | European Society for Precision Engineering and Nanotechnology, Conference Proceedings: 24th International Conference and Exhibition, EUSPEN 2024 - Dublin, Ireland Duration: 10 Jun 2024 → 14 Jun 2024 |
Conference
Conference | European Society for Precision Engineering and Nanotechnology, Conference Proceedings |
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Country/Territory | Ireland |
City | Dublin |
Period | 10/06/2024 → 14/06/2024 |
Keywords
- Float-zone crystal growth
- Root cause analysis
- Association rule mining