Robustizing Circuit Optimization using Huber Functions.

John W. Bandler, Radek M. Biernacki, Steve H. Chen, Li Gao, Kaj Madsen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    The authors introduce a novel approach to 'robustizing' microwave circuit optimization using Huber functions, both two-sided and one-sided. They compare Huber optimization with l/sub 1/, l/sub 2/, and minimax methods in the presence of faults, large and small measurement errors, bad starting points, and statistical uncertainties. They demonstrate FET statistical modeling, multiplexer optimization, analog fault location, and data fitting. They extend the Huber concept by introducing a 'one-sided' Huber function for large-scale optimization. For large-scale problems, the designer often attempts, by intuition, a preliminary optimization by selecting a small number of dominant variables. It is demonstrated, through multiplexer optimization, that the one-sided Huber function can be more effective and efficient than minimax in overcoming a bad starting point.
    Original languageEnglish
    Title of host publicationIEEE MTT Trans. Microwave Symp. Digest
    Publication date1993
    Pages1009-1012
    Publication statusPublished - 1993
    Event1993 IEEE MTT-S International Microwave Symposium - Atlanta, United States
    Duration: 14 Jun 199318 Jun 1993
    https://ieeexplore.ieee.org/xpl/conhome/694/proceeding?isnumber=6842

    Conference

    Conference1993 IEEE MTT-S International Microwave Symposium
    Country/TerritoryUnited States
    CityAtlanta
    Period14/06/199318/06/1993
    Internet address

    Keywords

    • circuit design
    • rubust estimation

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