Robust mapping of electrical properties of graphene from terahertz time-domain spectroscopy with timing jitter correction

Patrick Rebsdorf Whelan, Krzysztof Iwaszczuk, Ruizhi Wang, Stephan Hofmann, Peter Bøggild, Peter Uhd Jepsen

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We demonstrate a method for reliably determining the electrical properties of graphene including the carrier scattering time and carrier drift mobility from terahertz timedomain spectroscopy measurements (THz-TDS). By comparing transients originating from directly transmitted pulses and the echoes from internal reflections in a substrate, we are able to extract electrical properties irrespective of random time delays between pulses emitted in a THz-TDS setup. If such time delays are not accounted for they can significantly influence the extracted properties of the material. The technique is useful for a robust determination of electrical properties from THz-TDS measurements and is compatible with substrate materials where transients from internal reflections are well-separated in time.
Original languageEnglish
Article number2725
JournalOptics Express
Issue number3
Number of pages8
Publication statusPublished - 2017

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