RMS slope of exponentially correlated surface roughness for radar applications

Wolfgang Dierking

doi:10.1109/36.843040

RMS slope of exponentially correlated surface roughness for radar applications

Wolfgang Dierking

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Abstract

In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simulations are discussed

Original language	English
Journal	I E E E Transactions on Geoscience and Remote Sensing
Volume	38
Issue number	3
Pages (from-to)	1451-1454
ISSN	0196-2892
DOIs	https://doi.org/10.1109/36.843040
Publication status	Published - 2000

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Copyright: 2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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AB - In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the high frequency tail of the roughness spectrum. The choice of the cutoff frequency and the effect on surface scattering simulations are discussed

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RMS slope of exponentially correlated surface roughness for radar applications

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