Riesz transforms in statistical signal processing and their applications to speckle metrology: a review

Wei Wang, Shun Zhang, Ning Ma, Steen Grüner Hanson, Mitsuo Takeda

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    Abstract

    In this paper, a high-dimensional statistical signal processing is revisited with the aim of introducing the concept of vector signal representation derived from the Riesz transforms, which are the natural extension and generalization of the one-dimensional Hilbert transform. Under the new concepts of vector correlations proposed recently, the statistical properties of the vector signal representation for random signal are presented and some applications to speckle metrology developed recently are reviewed to demonstrate the unique capability of Riesz transforms.
    Original languageEnglish
    Title of host publicationProceedings of SPIE
    Number of pages9
    Volume9449
    PublisherSPIE - International Society for Optical Engineering
    Publication date2015
    Article number944904
    DOIs
    Publication statusPublished - 2015
    Event2014 International Conference on Photonics and Optical Engineering - Xi'an, China
    Duration: 13 Oct 201415 Oct 2014

    Conference

    Conference2014 International Conference on Photonics and Optical Engineering
    Country/TerritoryChina
    CityXi'an
    Period13/10/201415/10/2014
    SeriesProceedings of SPIE - The International Society for Optical Engineering
    ISSN0277-786X

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