Reversal of asymmetry of X-ray peak profiles from individual grains during a strain path change

Christian Wejdemann, U. Lienert, Wolfgang Pantleon

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    X-ray peak profiles are measured from individual bulk grains during tensile deformation. Two differently oriented copper samples pre-deformed in tension show the expected peak profile asymmetry caused by intra-grain stresses. One of the samples is oriented to achieve a significant change of the intra-grain stresses during in situ tensile loading and this is observed as a reversal of the sign of the peak profile asymmetry.
    Original languageEnglish
    JournalScripta Materialia
    Volume62
    Issue number10
    Pages (from-to)794-797
    ISSN1359-6462
    DOIs
    Publication statusPublished - 2010

    Keywords

    • Materials characterization and modelling
    • Materials and energy storage

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