Response of an annular electrostatic probe for a planar dielectric spacer: II

Torben Johansson; Iain Wilson McAllister

doi:10.1109/CEIDP.2004.1364219

Response of an annular electrostatic probe for a planar dielectric spacer: II

Torben Johansson
, Iain Wilson McAllister

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Abstract

The response of annular electrostatic probes mounted in an electrode is examined with reference to a planar dielectric spacer. On this occasion, the presence of a high-voltage point electrode is included in the system geometry. The study involves using the probe λ function to derive characteristic parameters. These parameters enable the response of such probes to be quantitatively assessed.

Original language	English
Title of host publication	Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04.
Publisher	IEEE
Publication date	2004
ISBN (Print)	0-7803-8584-5
DOIs	https://doi.org/10.1109/CEIDP.2004.1364219
Publication status	Published - 2004
Event	Conference on Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. - Duration: 1 Jan 2004 → …

Conference

Conference	Conference on Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04.
Period	01/01/2004 → …

Bibliographical note

Copyright: 2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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title = "Response of an annular electrostatic probe for a planar dielectric spacer: II",

abstract = "The response of annular electrostatic probes mounted in an electrode is examined with reference to a planar dielectric spacer. On this occasion, the presence of a high-voltage point electrode is included in the system geometry. The study involves using the probe λ function to derive characteristic parameters. These parameters enable the response of such probes to be quantitatively assessed.",

author = "Torben Johansson and McAllister, \{Iain Wilson\}",

note = "Copyright: 2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE; Conference on Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. ; Conference date: 01-01-2004",

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doi = "10.1109/CEIDP.2004.1364219",

language = "English",

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AU - McAllister, Iain Wilson

N1 - Copyright: 2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

PY - 2004

Y1 - 2004

N2 - The response of annular electrostatic probes mounted in an electrode is examined with reference to a planar dielectric spacer. On this occasion, the presence of a high-voltage point electrode is included in the system geometry. The study involves using the probe λ function to derive characteristic parameters. These parameters enable the response of such probes to be quantitatively assessed.

AB - The response of annular electrostatic probes mounted in an electrode is examined with reference to a planar dielectric spacer. On this occasion, the presence of a high-voltage point electrode is included in the system geometry. The study involves using the probe λ function to derive characteristic parameters. These parameters enable the response of such probes to be quantitatively assessed.

U2 - 10.1109/CEIDP.2004.1364219

DO - 10.1109/CEIDP.2004.1364219

M3 - Article in proceedings

SN - 0-7803-8584-5

BT - Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04.

PB - IEEE

T2 - Conference on Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04.

Y2 - 1 January 2004

ER -

Response of an annular electrostatic probe for a planar dielectric spacer: II

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