Resolution function for two-axis specular neutron reflectivity

W.G. Bouwman; J.S. Pedersen

doi:10.1107/S0021889895012751

Resolution function for two-axis specular neutron reflectivity

W.G. Bouwman, J.S. Pedersen

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

The resolution function for specular neutron reflectivity measurements of flat samples is calculated. The results are also applicable to some X-ray reflectivity set-ups. In a basic approach, the contributions of the wavelength spread and the angular divergence are calculated. The method of combining these contributions is discussed. These calculations are compared with some measured reflectivity curves. The calculations are checked with an analytical beam analysis method that takes directly into account the coupling between the angle, position and wavelength of the neutrons.

Original language	English
Journal	Journal of Applied Crystallography
Volume	29
Issue number	2
Pages (from-to)	152-158
ISSN	0021-8898
DOIs	https://doi.org/10.1107/S0021889895012751
Publication status	Published - 1996

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@article{34a7fbc9d32b42c5aefb28c385a22cf5,

title = "Resolution function for two-axis specular neutron reflectivity",

abstract = "The resolution function for specular neutron reflectivity measurements of flat samples is calculated. The results are also applicable to some X-ray reflectivity set-ups. In a basic approach, the contributions of the wavelength spread and the angular divergence are calculated. The method of combining these contributions is discussed. These calculations are compared with some measured reflectivity curves. The calculations are checked with an analytical beam analysis method that takes directly into account the coupling between the angle, position and wavelength of the neutrons.",

keywords = "Materialer med s{\ae}rlige fysiske og kemiske egenskaber; Nye funktionelle materialer",

author = "W.G. Bouwman and J.S. Pedersen",

year = "1996",

doi = "10.1107/S0021889895012751",

language = "English",

volume = "29",

pages = "152--158",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "Wiley-Blackwell",

number = "2",

}

TY - JOUR

T1 - Resolution function for two-axis specular neutron reflectivity

AU - Bouwman, W.G.

AU - Pedersen, J.S.

PY - 1996

Y1 - 1996

N2 - The resolution function for specular neutron reflectivity measurements of flat samples is calculated. The results are also applicable to some X-ray reflectivity set-ups. In a basic approach, the contributions of the wavelength spread and the angular divergence are calculated. The method of combining these contributions is discussed. These calculations are compared with some measured reflectivity curves. The calculations are checked with an analytical beam analysis method that takes directly into account the coupling between the angle, position and wavelength of the neutrons.

AB - The resolution function for specular neutron reflectivity measurements of flat samples is calculated. The results are also applicable to some X-ray reflectivity set-ups. In a basic approach, the contributions of the wavelength spread and the angular divergence are calculated. The method of combining these contributions is discussed. These calculations are compared with some measured reflectivity curves. The calculations are checked with an analytical beam analysis method that takes directly into account the coupling between the angle, position and wavelength of the neutrons.

KW - Materialer med særlige fysiske og kemiske egenskaber; Nye funktionelle materialer

U2 - 10.1107/S0021889895012751

DO - 10.1107/S0021889895012751

M3 - Journal article

SN - 0021-8898

VL - 29

SP - 152

EP - 158

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

IS - 2

ER -

Resolution function for two-axis specular neutron reflectivity

Abstract

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