Resolution function and flux at the sample for small-angle x-ray scattering calculated in position-angle-wavelength space

J.S. Pedersen, C. Riekel

Research output: Contribution to journal › Journal article › peer-review

Original language	English
Journal	Journal of Applied Crystallography
Volume	24
Pages (from-to)	893-909
ISSN	0021-8898
Publication status	Published - 1991

Cite this

@article{b199a03ee7904289a28bf236110a260e,

title = "Resolution function and flux at the sample for small-angle x-ray scattering calculated in position-angle-wavelength space",

keywords = "Materialers atomare struktur og egenskaber",

author = "J.S. Pedersen and C. Riekel",

year = "1991",

language = "English",

volume = "24",

pages = "893--909",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "Wiley-Blackwell",

}

TY - JOUR

T1 - Resolution function and flux at the sample for small-angle x-ray scattering calculated in position-angle-wavelength space

AU - Pedersen, J.S.

AU - Riekel, C.

PY - 1991

Y1 - 1991

KW - Materialers atomare struktur og egenskaber

M3 - Journal article

VL - 24

SP - 893

EP - 909

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

ER -