Resolution function and flux at the sample for small-angle x-ray scattering calculated in position-angle-wavelength space

J.S. Pedersen, C. Riekel

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalJournal of Applied Crystallography
    Volume24
    Pages (from-to)893-909
    ISSN0021-8898
    Publication statusPublished - 1991

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