Resolution effects and analysis of small-angle neutron scattering data

J.S. Pedersen

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    A discussion of the instrumental smearing effects for small-angle neutron scattering (SANS) data sets is given. It is shown that these effects can be described by a resolution function, which describes the distribution of scattering vectors probed for the nominal values of the scattering vector. The resolution function is independent of the scattering cross section of the sample and can be calculated once and for all for any instrumental setting. For scattering from isotropic system the resolution function allows the smeared intensity to be calculated by computing only one numerical integral. It is discussed how the resolution function can be calculated analytically. determined by Monte Carlo simulations, and measured. It is demonstrated that for typical SANS setups, the resolution function can be described by a Gaussian function to a good approximation. The incorporation of the function in computer programs for least-squares fits of known cross sections and for indirect Fourier transformations is discussed. Finally, some examples are given which demonstrate the application.
    Original languageEnglish
    JournalJournal de physique iv
    Volume3
    Issue numberC8
    Pages (from-to)491-498
    ISSN1155-4339
    DOIs
    Publication statusPublished - 1993
    Event9th International Conference on Small Angle Scattering - Saclay, France
    Duration: 27 Apr 199330 Apr 1993
    Conference number: 9

    Conference

    Conference9th International Conference on Small Angle Scattering
    Number9
    CountryFrance
    CitySaclay
    Period27/04/199330/04/1993

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