Residual strain profiles in alumina-zirconia ceramic composites

Jesus Ruiz-Hervias; Axel Steuwer; Jonas Gurauskis; Thomas Buslaps; Carmen Baudin

doi:10.4028/www.scientific.net/MSF.652.57

Residual strain profiles in alumina-zirconia ceramic composites

Jesus Ruiz-Hervias, Axel Steuwer, Jonas Gurauskis, Thomas Buslaps, Carmen Baudin

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

Residual strain profiles were measured by synchrotron X-ray radiation in AI2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions. Different behaviour is observed for the strains along the in-plane and normal directions.

Original language	English
Journal	Materials Science Forum
Volume	652
Pages (from-to)	57-62
ISSN	0255-5476
DOIs	https://doi.org/10.4028/www.scientific.net/MSF.652.57
Publication status	Published - 2010
Externally published	Yes

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title = "Residual strain profiles in alumina-zirconia ceramic composites",

abstract = "Residual strain profiles were measured by synchrotron X-ray radiation in AI2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.\% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions. Different behaviour is observed for the strains along the in-plane and normal directions.",

author = "Jesus Ruiz-Hervias and Axel Steuwer and Jonas Gurauskis and Thomas Buslaps and Carmen Baudin",

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AU - Ruiz-Hervias, Jesus

AU - Steuwer, Axel

AU - Gurauskis, Jonas

AU - Buslaps, Thomas

AU - Baudin, Carmen

PY - 2010

Y1 - 2010

N2 - Residual strain profiles were measured by synchrotron X-ray radiation in AI2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions. Different behaviour is observed for the strains along the in-plane and normal directions.

AB - Residual strain profiles were measured by synchrotron X-ray radiation in AI2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions. Different behaviour is observed for the strains along the in-plane and normal directions.

U2 - 10.4028/www.scientific.net/MSF.652.57

DO - 10.4028/www.scientific.net/MSF.652.57

M3 - Journal article

SN - 0255-5476

VL - 652

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EP - 62

JO - Materials Science Forum

JF - Materials Science Forum

ER -

Residual strain profiles in alumina-zirconia ceramic composites

Abstract

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