Residual strain profiles in alumina-zirconia ceramic composites

Jesus Ruiz-Hervias, Axel Steuwer, Jonas Gurauskis, Thomas Buslaps, Carmen Baudin

Research output: Contribution to journalJournal articleResearchpeer-review


Residual strain profiles were measured by synchrotron X-ray radiation in AI2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions. Different behaviour is observed for the strains along the in-plane and normal directions.
Original languageEnglish
JournalMaterials Science Forum
Pages (from-to)57-62
Publication statusPublished - 2010
Externally publishedYes


Dive into the research topics of 'Residual strain profiles in alumina-zirconia ceramic composites'. Together they form a unique fingerprint.

Cite this