Residual strain profiles in alumina-zirconia ceramic composites

Jesus Ruiz-Hervias, Axel Steuwer, Jonas Gurauskis, Thomas Buslaps, Carmen Baudin

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Residual strain profiles were measured by synchrotron X-ray radiation in AI2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions. Different behaviour is observed for the strains along the in-plane and normal directions.
Original languageEnglish
JournalMaterials Science Forum
Volume652
Pages (from-to)57-62
ISSN0255-5476
DOIs
Publication statusPublished - 2010
Externally publishedYes

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