Abstract
Gallium Nitride (GaN) transistor in the high power density converter application is widely researched nowadays. High frequency switching largely reduces the volume of passive components and also leads to challenges in the PCB layout. Parasitic inductance within the critical power loop should be minimized to fully harness the potential of GaN transistor fast switching capability. This paper provides a numerical method for the power loop inductance quantification. Experimental results
on the synchronous buck converter are given to validate the estimation accuracy.
on the synchronous buck converter are given to validate the estimation accuracy.
Original language | English |
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Title of host publication | Proceedings of IEEE Workshop on Wide Bandgap Power Devices and Applications |
Number of pages | 5 |
Publisher | IEEE |
Publication date | 2019 |
ISBN (Print) | 9781728121451 |
DOIs | |
Publication status | Published - 2019 |
Event | IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia 2019 - Howard International House, Taipei, Taiwan, Province of China Duration: 23 May 2019 → 25 May 2019 http://www.wipda-asia2019.org/ |
Workshop
Workshop | IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia 2019 |
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Location | Howard International House |
Country/Territory | Taiwan, Province of China |
City | Taipei |
Period | 23/05/2019 → 25/05/2019 |
Internet address |
Keywords
- Power loop inductance
- GaN transistor
- Finite element analysis