Abstract
The present investigation addresses one of the key challenges in the product quality control of transparent polymer substrates, identified in the replication fidelity of sub-μm structures over large area. Additionally the work contributes to the development of new techniques focused on in-line characterization of large nanostructured surfaces. In particular the aim of the present paper is to introduce initial development of a metrology approach to quantify the replication fidelity of produced 500 nm diameter semi-spheres via anodizing of aluminum (Al) and subsequent nickel electroforming to COC injection molded polymer parts. Calibrated AFM measurements were used to develop a model based on scalar diffraction theory able to calculate the expected nickel and COC substrates angular distribution of reflected and transmitted intensity respectively.
| Original language | English |
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| Publication date | 2015 |
| Number of pages | 1 |
| Publication status | Published - 2015 |
| Event | 15th International Conference on Metrology and Properties of Engineering Surfaces - University of North Carolina, Charlotte, United States Duration: 2 Mar 2015 → 5 Mar 2015 Conference number: 15 |
Conference
| Conference | 15th International Conference on Metrology and Properties of Engineering Surfaces |
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| Number | 15 |
| Location | University of North Carolina |
| Country/Territory | United States |
| City | Charlotte |
| Period | 02/03/2015 → 05/03/2015 |
Keywords
- Nano structures replication
- Atomic force microscopy (AFM);
- Angular intensity distribution