Reliable Operation for 14500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm

Bernd Sumpf; Martin Maiwald; André Müller; Arnim Ginolas; Karl Häusler; Goetz Erbert; Guenther Tränkle

doi:10.1109/TCPMT.2011.2171342

Reliable Operation for 14500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm

Bernd Sumpf, Martin Maiwald, André Müller, Arnim Ginolas, Karl Häusler, Goetz Erbert, Guenther Tränkle

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Abstract

Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm $\times\,$4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25$^{\circ}{\rm C}$ and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.

Original language	English
Journal	I E E E Transactions on Components, Packaging and Manufacturing Technology
Volume	2
Issue number	1
Pages (from-to)	116-121
ISSN	2156-3950
DOIs	https://doi.org/10.1109/TCPMT.2011.2171342
Publication status	Published - 2012

Keywords

Semiconductor lasers
Raman spectroscopy
High-power lasers
Reliability
Laser resonators

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title = "Reliable Operation for 14500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm",

abstract = "Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm $\times\,$4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25$^{\circ}{\rm C}$ and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.",

keywords = "Semiconductor lasers, Raman spectroscopy, High-power lasers, Reliability, Laser resonators",

author = "Bernd Sumpf and Martin Maiwald and Andr{\'e} M{\"u}ller and Arnim Ginolas and Karl H{\"a}usler and Goetz Erbert and Guenther Tr{\"a}nkle",

year = "2012",

doi = "10.1109/TCPMT.2011.2171342",

language = "English",

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T1 - Reliable Operation for 14500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm

AU - Sumpf, Bernd

AU - Maiwald, Martin

AU - Müller, André

AU - Ginolas, Arnim

AU - Häusler, Karl

AU - Erbert, Goetz

AU - Tränkle, Guenther

PY - 2012

Y1 - 2012

N2 - Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm $\times\,$4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25$^{\circ}{\rm C}$ and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.

AB - Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm $\times\,$4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25$^{\circ}{\rm C}$ and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.

KW - Semiconductor lasers

KW - Raman spectroscopy

KW - High-power lasers

KW - Reliability

KW - Laser resonators

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M3 - Journal article

SN - 2156-3950

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EP - 121

JO - I E E E Transactions on Components, Packaging and Manufacturing Technology

JF - I E E E Transactions on Components, Packaging and Manufacturing Technology

IS - 1

ER -

Reliable Operation for 14500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm

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