Reliable Operation for 14500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm

Bernd Sumpf, Martin Maiwald, André Müller, Arnim Ginolas, Karl Häusler, Goetz Erbert, Guenther Tränkle

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Abstract

Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm $\times\,$4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25$^{\circ}{\rm C}$ and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.
Original languageEnglish
JournalI E E E Transactions on Components, Packaging and Manufacturing Technology
Volume2
Issue number1
Pages (from-to)116-121
ISSN2156-3950
DOIs
Publication statusPublished - 2012

Keywords

  • Semiconductor lasers
  • Raman spectroscopy
  • High-power lasers
  • Reliability
  • Laser resonators

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