Recovery of small orientation gradients in a recrystallized grain observed in 3D during ex-situ annealing

Chuanshi Hong; Yubin Zhang; Tianbo Yu; Wenjun Liu; Dorte Juul Jensen

doi:10.1088/1757-899X/1249/1/012050

Recovery of small orientation gradients in a recrystallized grain observed in 3D during ex-situ annealing

Chuanshi Hong^*, Yubin Zhang, Tianbo Yu, Wenjun Liu, Dorte Juul Jensen^*

^*Corresponding author for this work

Argonne National Laboratory

Research output: Contribution to journal › Conference article › Research › peer-review

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Abstract

We report the observation of a small orientation gradient (~0.5° over a few micrometers) in a recrystallized grain formed at the sample surface in pure Al and the elimination of this orientation gradient during subsequential ex-situ annealing. The observation is in 3D and done using synchrotron white-beam differential-aperture X-ray microscopy with high angular resolution of 0.01°. The elimination of the orientation gradient during subsequent annealing are analyzed and discussed.

Original language	English
Article number	012050
Journal	IOP Conference Series: Materials Science and Engineering
Volume	1249
Number of pages	6
ISSN	1757-8981
DOIs	https://doi.org/10.1088/1757-899X/1249/1/012050
Publication status	Published - 2022
Event	42nd Risø International Symposium on Materials Science - Risø, Denmark Duration: 5 Sept 2022 → 9 Sept 2022 https://www.conferencemanager.dk/42ndsymposium/program

Conference

Conference	42nd Risø International Symposium on Materials Science
Country/Territory	Denmark
City	Risø
Period	05/09/2022 → 09/09/2022
Internet address	https://www.conferencemanager.dk/42ndsymposium/program

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title = "Recovery of small orientation gradients in a recrystallized grain observed in 3D during ex-situ annealing",

abstract = "We report the observation of a small orientation gradient (~0.5° over a few micrometers) in a recrystallized grain formed at the sample surface in pure Al and the elimination of this orientation gradient during subsequential ex-situ annealing. The observation is in 3D and done using synchrotron white-beam differential-aperture X-ray microscopy with high angular resolution of 0.01°. The elimination of the orientation gradient during subsequent annealing are analyzed and discussed.",

author = "Chuanshi Hong and Yubin Zhang and Tianbo Yu and Wenjun Liu and Jensen, {Dorte Juul}",

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T1 - Recovery of small orientation gradients in a recrystallized grain observed in 3D during ex-situ annealing

AU - Hong, Chuanshi

AU - Zhang, Yubin

AU - Yu, Tianbo

AU - Liu, Wenjun

AU - Jensen, Dorte Juul

PY - 2022

Y1 - 2022

N2 - We report the observation of a small orientation gradient (~0.5° over a few micrometers) in a recrystallized grain formed at the sample surface in pure Al and the elimination of this orientation gradient during subsequential ex-situ annealing. The observation is in 3D and done using synchrotron white-beam differential-aperture X-ray microscopy with high angular resolution of 0.01°. The elimination of the orientation gradient during subsequent annealing are analyzed and discussed.

AB - We report the observation of a small orientation gradient (~0.5° over a few micrometers) in a recrystallized grain formed at the sample surface in pure Al and the elimination of this orientation gradient during subsequential ex-situ annealing. The observation is in 3D and done using synchrotron white-beam differential-aperture X-ray microscopy with high angular resolution of 0.01°. The elimination of the orientation gradient during subsequent annealing are analyzed and discussed.

U2 - 10.1088/1757-899X/1249/1/012050

DO - 10.1088/1757-899X/1249/1/012050

M3 - Conference article

SN - 1757-8981

VL - 1249

JO - IOP Conference Series: Materials Science and Engineering

JF - IOP Conference Series: Materials Science and Engineering

M1 - 012050

T2 - 42nd Risø International Symposium on Materials Science

Y2 - 5 September 2022 through 9 September 2022

ER -

Recovery of small orientation gradients in a recrystallized grain observed in 3D during ex-situ annealing

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