Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.
|Publication status||Published - 2011|
|Event||Microscopy of Semiconducting Materials - Cambridge, United Kingdom|
Duration: 1 Jan 2011 → …
Conference number: 17
|Conference||Microscopy of Semiconducting Materials|
|City||Cambridge, United Kingdom|
|Period||01/01/2011 → …|