Abstract
Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.
| Original language | English |
|---|---|
| Publication date | 2011 |
| Publication status | Published - 2011 |
| Event | Microscopy of Semiconducting Materials - Cambridge, United Kingdom Duration: 1 Jan 2011 → … Conference number: 17 |
Conference
| Conference | Microscopy of Semiconducting Materials |
|---|---|
| Number | 17 |
| City | Cambridge, United Kingdom |
| Period | 01/01/2011 → … |
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